1. It is mainly used for testing the DC parameters of manifold semiconductors such as diode, transistor, controlled silicon and field effect transistor.It also can be used to test the with stand voltage of capacitor, protection voltage of varistor and isolation of electrica.
2. Measuring forward voltage, reverse voltage, forward saturation voltage drop, amplification factor, reverse leakage current of various crystal diode, audion, silicon controlled rectifier(SCR), field effect transistor(FET).
3. Measuring rated working voltage of chemical capacitor, terylene capacitor, capacitor, Leaded multilayer ceramic capacitor, high voltage lacker.
4. Measuring protection voltage of varistor.
5. Data hold, low battery warning.
2. Measuring forward voltage, reverse voltage, forward saturation voltage drop, amplification factor, reverse leakage current of various crystal diode, audion, silicon controlled rectifier(SCR), field effect transistor(FET).
3. Measuring rated working voltage of chemical capacitor, terylene capacitor, capacitor, Leaded multilayer ceramic capacitor, high voltage lacker.
4. Measuring protection voltage of varistor.
5. Data hold, low battery warning.